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"Hot Carrier Reliability Improvement of Thicker Gate Oxide nFET Devices in ..."

M. Iqbal Mahmud et al. (2019)

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DOI: 10.1109/IRPS.2019.8720535

access: closed

type: Conference or Workshop Paper

metadata version: 2021-12-24

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  - conf/irps/MahmudGTMJSZRCM19
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  - https://dblp.org/rec/conf/irps/MahmudGTMJSZRCM19
M. Iqbal Mahmud, Amit Gupta, Maria Toledano-Luque, N. Rao Mavilla, J. Johnson, P. Srinivasan, A. Zainuddin, S. Rao, Salvatore Cimino, Byoung Min, Tanya Nigam:
Hot Carrier Reliability Improvement of Thicker Gate Oxide nFET Devices in Advanced FinFETs. IRPS 2019: 1-6

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