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"2×VDD-tolerant power-rail ESD clamp circuit with low standby leakage ..."

Chun-Yu Lin, Ming-Dou Ker (2010)

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DOI: 10.1109/ISCAS.2010.5537864

access: closed

type: Conference or Workshop Paper

metadata version: 2022-05-04

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Chun-Yu Lin, Ming-Dou Ker:
2×VDD-tolerant power-rail ESD clamp circuit with low standby leakage in 65-nm CMOS process. ISCAS 2010: 3417-3420

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