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"Efficient post-silicon validation via segmentation of process variation ..."

Prasanjeet Das, Sandeep K. Gupta (2014)

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DOI: 10.1109/ISQED.2014.6783314

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-26

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Prasanjeet Das, Sandeep K. Gupta:
Efficient post-silicon validation via segmentation of process variation envelope - Global vs local variations. ISQED 2014: 115-122

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