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"Test-Driven Development as a Defect-Reduction Practice."

Laurie A. Williams, E. Michael Maximilien, Mladen A. Vouk (2003)

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DOI: 10.1109/ISSRE.2003.1251029

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/conf/issre/WilliamsMV03
Laurie A. Williams, E. Michael Maximilien, Mladen A. Vouk:
Test-Driven Development as a Defect-Reduction Practice. ISSRE 2003: 34-48

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