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"Impact of Process Variations on Reliability and Performance of 32-nm 6T ..."

Lingbo Kou, William H. Robinson (2014)

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DOI: 10.1109/ISVLSI.2014.73

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/isvlsi/KouR14
Lingbo Kou, William H. Robinson:
Impact of Process Variations on Reliability and Performance of 32-nm 6T SRAM at Near Threshold Voltage. ISVLSI 2014: 214-219

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