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ORCID"A Scalable Scan-Path Test Point Insertion Technique to Enhance Delay Fault ..."
Seongmoon Wang, Srimat T. Chakradhar (2003)
- Seongmoon Wang, Srimat T. Chakradhar:
A Scalable Scan-Path Test Point Insertion Technique to Enhance Delay Fault Coverage for Standard Scan Designs. ITC 2003: 574-583
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