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"A Novel Gate-Level NBTI Delay Degradation Model with Stacking Effect."
Hong Luo et al. (2007)
- Hong Luo, Yu Wang, Ku He, Rong Luo, Huazhong Yang, Yuan Xie:
A Novel Gate-Level NBTI Delay Degradation Model with Stacking Effect. PATMOS 2007: 160-170
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