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"Reliability Modeling of Two-Phase Gamma Degradation Process."

Fengjun Duan, Guanjun Wang (2017)

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DOI: 10.1109/QRS-C.2017.118

access: closed

type: Conference or Workshop Paper

metadata version: 2017-08-16

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  dblp key:
  - conf/qrs/DuanW17
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Fengjun Duan, Guanjun Wang:
Reliability Modeling of Two-Phase Gamma Degradation Process. QRS Companion 2017: 620-621

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