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"The Pros and Cons of Very-Low-Voltage Testing: An Analysis based on ..."

Piet Engelke et al. (2004)

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DOI: 10.1109/VTEST.2004.1299240

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - conf/vts/EngelkePRSB04
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  - https://dblp.org/rec/conf/vts/EngelkePRSB04
Piet Engelke, Ilia Polian, Michel Renovell, Bharath Seshadri, Bernd Becker:
The Pros and Cons of Very-Low-Voltage Testing: An Analysis based on Resistive Bridging Faults. VTS 2004: 171-178

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