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ORCID"Total Ionizing Dose Hardening of 45 nm FD-SOI MOSFETs Using Body-Tie Biasing."
Xiaoqiang Liu et al. (2019)
- Xiaoqiang Liu
, Li Cai, Baojun Liu, Xiaokuo Yang, Huanqing Cui, Cheng Li:
Total Ionizing Dose Hardening of 45 nm FD-SOI MOSFETs Using Body-Tie Biasing. IEEE Access 7: 51276-51283 (2019)
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last updated on 2019-05-31 09:48 CEST by the dblp team
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