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"Exploring the Interaction Between Device Lifetime Reliability and Security ..."

Chen-Han Ho et al. (2011)

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DOI: 10.1109/L-CA.2011.16

access: closed

type: Journal Article

metadata version: 2023-08-28

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  persistent URL:
  - https://dblp.org/rec/journals/cal/HoSUS11
Chen-Han Ho, Garret Staus, Aaron Ullmer, Karu Sankaralingam:
Exploring the Interaction Between Device Lifetime Reliability and Security Vulnerabilities. IEEE Comput. Archit. Lett. 10(2): 37-40 (2011)

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