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"Embedded-Memory Test and Repair: Infrastructure IP for SoC Yield."

Yervant Zorian, Samvel K. Shoukourian (2003)

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DOI: 10.1109/MDT.2003.1198687

access: closed

type: Journal Article

metadata version: 2020-05-17

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/journals/dt/ZorianS03
Yervant Zorian, Samvel K. Shoukourian:
Embedded-Memory Test and Repair: Infrastructure IP for SoC Yield. IEEE Des. Test Comput. 20(3): 58-66 (2003)

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