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"Low Cost BIST for Static and Dynamic Testing of ADCs."

Maria Da Gloria Flores et al. (2005)

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DOI: 10.1007/S10836-005-6357-5

access: closed

type: Journal Article

metadata version: 2023-09-30

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Maria Da Gloria Flores, Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin, Felipe R. Clayton, Cristiano Benevento:
Low Cost BIST for Static and Dynamic Testing of ADCs. J. Electron. Test. 21(3): 283-290 (2005)

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