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"NBTI Reliability of PFETs under Post-Fabrication Self-Improvement Scheme ..."

Nurul Ezaila Alias et al. (2013)

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DOI: 10.1587/TRANSELE.E96.C.620

access: closed

type: Journal Article

metadata version: 2020-04-11

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  persistent URL:
  - https://dblp.org/rec/journals/ieicet/AliasKSMH13
Nurul Ezaila Alias, Anil Kumar, Takuya Saraya, Shinji Miyano, Toshiro Hiramoto:
NBTI Reliability of PFETs under Post-Fabrication Self-Improvement Scheme for SRAM. IEICE Trans. Electron. 96-C(5): 620-623 (2013)

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