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"Optimal Burn-in for Minimizing Total Warranty Cost."

Ji Hwan Cha, Hisashi Yamamoto, Won Young Yun (2008)

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DOI: 10.1093/IETFEC/E91-A.2.633

access: closed

type: Journal Article

metadata version: 2020-04-11

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  - https://dblp.org/rec/journals/ieicet/ChaYY08
Ji Hwan Cha, Hisashi Yamamoto, Won Young Yun:
Optimal Burn-in for Minimizing Total Warranty Cost. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 91-A(2): 633-641 (2008)

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