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"Stress Probability Computation for Estimating NBTI-Induced Delay Degradation."

Hiroaki Konoura et al. (2011)

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DOI: 10.1587/TRANSFUN.E94.A.2545

access: closed

type: Journal Article

metadata version: 2022-01-03

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  dblp key:
  - journals/ieicet/KonouraMHO11
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  persistent URL:
  - https://dblp.org/rec/journals/ieicet/KonouraMHO11
Hiroaki Konoura, Yukio Mitsuyama, Masanori Hashimoto, Takao Onoye:
Stress Probability Computation for Estimating NBTI-Induced Delay Degradation. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 94-A(12): 2545-2553 (2011)

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