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"Effect of BIST Pretest on IC Defect Level."

Yoshiyuki Nakamura, Jacob Savir, Hideo Fujiwara (2006)

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DOI: 10.1093/IETISY/E89-D.10.2626

access: closed

type: Journal Article

metadata version: 2020-04-11

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Yoshiyuki Nakamura, Jacob Savir, Hideo Fujiwara:
Effect of BIST Pretest on IC Defect Level. IEICE Trans. Inf. Syst. 89-D(10): 2626-2636 (2006)

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