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"A New Method for Low-Capture-Power Test Generation for Scan Testing."
Xiaoqing Wen et al. (2006)
- Xiaoqing Wen, Yoshiyuki Yamashita, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja, Kozo Kinoshita:
A New Method for Low-Capture-Power Test Generation for Scan Testing. IEICE Trans. Inf. Syst. 89-D(5): 1679-1686 (2006)
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