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"Fault detection in TFCMOS/DFCMOS combinational gates."
Giacomo Buonanno et al. (1993)
- Giacomo Buonanno, Fabrizio Lombardi, Donatella Sciuto, Yinan N. Shen:
Fault detection in TFCMOS/DFCMOS combinational gates. Integr. 15(2): 201-227 (1993)
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