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"Detection of counterfeited ICs via on-chip sensor and post-fabrication ..."

Taeyoung Kim et al. (2018)

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DOI: 10.1016/J.VLSI.2018.05.002

access: closed

type: Journal Article

metadata version: 2021-02-19

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Taeyoung Kim, Sheldon X.-D. Tan, Chase Cook, Zeyu Sun:
Detection of counterfeited ICs via on-chip sensor and post-fabrication authentication policy. Integr. 63: 31-40 (2018)

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