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"Lifetime improvement by exploiting aggressive voltage scaling during ..."

Farzaneh Nakhaee et al. (2018)

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DOI: 10.1016/J.VLSI.2017.10.013

access: closed

type: Journal Article

metadata version: 2020-10-26

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Farzaneh Nakhaee, Mehdi Kamal, Ali Afzali-Kusha, Massoud Pedram, Sied Mehdi Fakhraie, Hamed Dorosti:
Lifetime improvement by exploiting aggressive voltage scaling during runtime of error-resilient applications. Integr. 61: 29-38 (2018)

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