"IoT Metrology."

Jeffrey M. Voas, Rick Kuhn, Phillip A. Laplante (2018)

Details and statistics

DOI: 10.1109/MITP.2018.032501740

access: closed

type: Journal Article

metadata version: 2020-03-12

a service of  Schloss Dagstuhl - Leibniz Center for Informatics