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"Fault Detection for the class Imbalance Problem in semiconductor ..."

Jian Wang, Jian Feng, Zhiyan Han (2014)

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DOI: 10.1142/S0218126614500492

access: closed

type: Journal Article

metadata version: 2024-03-08

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Jian Wang, Jian Feng, Zhiyan Han:
Fault Detection for the class Imbalance Problem in semiconductor manufacturing Processes. J. Circuits Syst. Comput. 23(4) (2014)

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