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"Statistical aspects of the degradation of LDD nMOSFETs."

E. Andries et al. (2002)

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DOI: 10.1016/S0026-2714(02)00160-9

access: closed

type: Journal Article

metadata version: 2023-09-30

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  - https://dblp.org/rec/journals/mr/AndriesDCCSGLDD02
E. Andries, R. Dreesen, Kris Croes, Ward De Ceuninck, Luc De Schepper, Guido Groeseneken, K. F. Lo, Marc D'Olieslaeger, Jan D'Haen:
Statistical aspects of the degradation of LDD nMOSFETs. Microelectron. Reliab. 42(9-11): 1409-1413 (2002)

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