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"Study of short-circuit robustness of SiC MOSFETs, analysis of the failure ..."

Cheng Chen et al. (2015)

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DOI: 10.1016/J.MICROREL.2015.06.097

access: closed

type: Journal Article

metadata version: 2023-03-21

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Cheng Chen, Denis Labrousse, Stéphane Lefebvre, Mickael Petit, Cyril Buttay, Hervé Morel:
Study of short-circuit robustness of SiC MOSFETs, analysis of the failure modes and comparison with BJTs. Microelectron. Reliab. 55(9-10): 1708-1713 (2015)

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