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"Combined simulation and optical measurement technique for investigation of ..."

Rainer Dudek et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.02.016

access: closed

type: Journal Article

metadata version: 2022-10-02

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  - https://dblp.org/rec/journals/mr/DudekHRFDSO18
Rainer Dudek, M. Hildebrand, Sven Rzepka, T. Fries, Ralf Döring, Bettina Seiler, R. W. Ortmann:
Combined simulation and optical measurement technique for investigation of system effects on components solder fatigue. Microelectron. Reliab. 83: 162-172 (2018)

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