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"NBTI degradation: From physical mechanisms to modelling."

Vincent Huard, M. Denais, C. R. Parthasarathy (2006)

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DOI: 10.1016/J.MICROREL.2005.02.001

access: closed

type: Journal Article

metadata version: 2020-02-22

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Vincent Huard, M. Denais, C. R. Parthasarathy:
NBTI degradation: From physical mechanisms to modelling. Microelectron. Reliab. 46(1): 1-23 (2006)

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