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"A voltage calibration technique of electro-optic probing for ..."

Hongfei Liu et al. (2007)

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DOI: 10.1016/J.MICROREL.2006.05.007

access: closed

type: Journal Article

metadata version: 2020-02-22

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Hongfei Liu, Alin Hou, Hongbo Zhang, Daming Zhang, Maobin Yi:
A voltage calibration technique of electro-optic probing for characterization internal to IC's chip. Microelectron. Reliab. 47(1): 82-87 (2007)

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