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"Application of coupled electro-thermal and physics-of-failure-based ..."

Mahera Musallam et al. (2014)

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DOI: 10.1016/J.MICROREL.2013.08.017

access: closed

type: Journal Article

metadata version: 2020-02-22

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Mahera Musallam, Chunyan Yin, Chris Bailey, C. Mark Johnson:
Application of coupled electro-thermal and physics-of-failure-based analysis to the design of accelerated life tests for power modules. Microelectron. Reliab. 54(1): 172-181 (2014)

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