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"Study of stress-induced leakage current (SILC) in ..."
M. S. Rahman et al. (2009)
- M. S. Rahman, E. K. Evangelou, I. I. Androulidakis, Athanasios Dimoulas:
Study of stress-induced leakage current (SILC) in HfO2/Dy2O3 high-kappa gate stacks on germanium. Microelectron. Reliab. 49(1): 26-31 (2009)
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