Stop the war!
Остановите войну!
for scientists:
default search action
"Back-end soft and hard defect monitoring using a single test chip."
Fabrice Rigaud et al. (2011)
- Fabrice Rigaud, Jean-Michel Portal, Hassen Aziza, Didier Née, Julien Vast, Fabrice Argoud, Bertrand Borot:
Back-end soft and hard defect monitoring using a single test chip. Microelectron. Reliab. 51(6): 1136-1141 (2011)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.