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"Failure analysis and improvement of 60 V power UMOSFET."

Debo Wang et al. (2014)

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DOI: 10.1016/J.MICROREL.2014.07.003

access: closed

type: Journal Article

metadata version: 2020-02-22

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Debo Wang, Quanyuan Feng, Xiaopei Chen, Tao Jin:
Failure analysis and improvement of 60 V power UMOSFET. Microelectron. Reliab. 54(12): 2782-2787 (2014)

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