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"The total ionizing dose response of leading-edge FDSOI MOSFETs."

Jian Wang et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.07.080

access: closed

type: Journal Article

metadata version: 2021-02-26

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  - journals/mr/WangLHZYZGXGCC18
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  - https://dblp.org/rec/journals/mr/WangLHZYZGXGCC18
Jian Wang, Binhong Li, Yang Huang, Kai Zhao, Fang Yu, Qiwen Zheng, Qi Guo, Liewei Xu, J. Gao, X. Cai, Y. Cui:
The total ionizing dose response of leading-edge FDSOI MOSFETs. Microelectron. Reliab. 88-90: 979-983 (2018)

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