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"Improvement of MOSFET matching characterization with calibrated ..."

Loic Welter et al. (2015)

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DOI: 10.1016/J.MICROREL.2015.06.104

access: closed

type: Journal Article

metadata version: 2021-12-24

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Loic Welter, J. L. Scotto di Quaquero, Philippe Dreux, Laurent Lopez, Hassen Aziza, Jean-Michel Portal:
Improvement of MOSFET matching characterization with calibrated multiplexed test structure. Microelectron. Reliab. 55(9-10): 1328-1333 (2015)

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