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"Investigation and impact of LDD variations on the drain disturb in ..."

Zhaozhao Xu et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.03.039

access: closed

type: Journal Article

metadata version: 2021-12-25

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  - https://dblp.org/rec/journals/mr/XuLXHDCQKZ18
Zhaozhao Xu, Donghua Liu, Wei Xiong, Jun Hu, Wenting Duan, Hualun Chen, Wensheng Qian, Weiran Kong, Shichang Zou:
Investigation and impact of LDD variations on the drain disturb in normally-on SONOS NOR flash device. Microelectron. Reliab. 84: 157-162 (2018)

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