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"Efficient Proximity Probing Algorithms for Metrology."

Aviv Adler et al. (2015)

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DOI: 10.1109/TASE.2014.2357763

access: closed

type: Journal Article

metadata version: 2020-10-26

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  - journals/tase/AdlerPSG15
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  - https://dblp.org/rec/journals/tase/AdlerPSG15
Aviv Adler, Fatemeh Panahi, A. Frank van der Stappen, Kenneth Y. Goldberg:
Efficient Proximity Probing Algorithms for Metrology. IEEE Trans Autom. Sci. Eng. 12(1): 84-95 (2015)

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