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"Information Assurance Through Redundant Design: A Novel TNU ..."

Aibin Yan et al. (2020)

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DOI: 10.1109/TC.2020.2966200

access: closed

type: Journal Article

metadata version: 2020-06-16

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  - journals/tc/YanHCCHNGW20
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  - https://dblp.org/rec/journals/tc/YanHCCHNGW20
Aibin Yan, Yuanjie Hu, Jie Cui, Zhili Chen, Zhengfeng Huang, Tianming Ni, Patrick Girard, Xiaoqing Wen:
Information Assurance Through Redundant Design: A Novel TNU Error-Resilient Latch for Harsh Radiation Environment. IEEE Trans. Computers 69(6): 789-799 (2020)

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