"Yield prediction by sampling IC layout."

Gerard A. Allan (2000)

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DOI: 10.1109/43.833204

access: closed

type: Journal Article

metadata version: 2020-09-24

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Gerard A. Allan:
Yield prediction by sampling IC layout. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 19(3): 359-371 (2000)

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