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"Thermal Analysis and Interpolation Techniques for a Logic + WideIO Stacked ..."
Francesco Beneventi et al. (2016)
- Francesco Beneventi, Andrea Bartolini, Pascal Vivet, Luca Benini:
Thermal Analysis and Interpolation Techniques for a Logic + WideIO Stacked DRAM Test Chip. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35(4): 623-636 (2016)
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