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"Test response compaction using multiplexed parity trees."

Krishnendu Chakrabarty, John P. Hayes (1996)

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DOI: 10.1109/43.543772

access: closed

type: Journal Article

metadata version: 2022-01-03

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  - journals/tcad/ChakrabartyH96
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  - https://dblp.org/rec/journals/tcad/ChakrabartyH96
Krishnendu Chakrabarty, John P. Hayes:
Test response compaction using multiplexed parity trees. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 15(11): 1399-1408 (1996)

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