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"Low-Power Test Data Application in EDT Environment Through Decompressor ..."

Dariusz Czysz et al. (2008)

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DOI: 10.1109/TCAD.2008.923111

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - https://dblp.org/rec/journals/tcad/CzyszMRT08
Dariusz Czysz, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer:
Low-Power Test Data Application in EDT Environment Through Decompressor Freeze. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(7): 1278-1290 (2008)

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