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"Analog testing by characteristic observation inference."

Walter M. Lindermeir, Helmut E. Graeb, Kurt Antreich (1999)

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DOI: 10.1109/43.784126

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - journals/tcad/LindermeirGA99
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  - https://dblp.org/rec/journals/tcad/LindermeirGA99
Walter M. Lindermeir, Helmut E. Graeb, Kurt Antreich:
Analog testing by characteristic observation inference. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 18(9): 1353-1368 (1999)

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