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"Clock Sequences for Increasing the Fault Coverage of Functional Test ..."

Irith Pomeranz (2017)

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DOI: 10.1109/TCAD.2016.2622622

access: closed

type: Journal Article

metadata version: 2020-09-24

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Irith Pomeranz:
Clock Sequences for Increasing the Fault Coverage of Functional Test Sequences. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36(7): 1231-1235 (2017)

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