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"On improving test quality of scan-based BIST."

Huan-Chih Tsai, Kwang-Ting Cheng, Sudipta Bhawmik (2000)

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DOI: 10.1109/43.856978

access: closed

type: Journal Article

metadata version: 2022-12-07

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Huan-Chih Tsai, Kwang-Ting Cheng, Sudipta Bhawmik:
On improving test quality of scan-based BIST. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 19(8): 928-938 (2000)

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