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"Modular SOC testing with reduced wrapper count."

Qiang Xu, Nicola Nicolici (2005)

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DOI: 10.1109/TCAD.2005.852447

access: closed

type: Journal Article

metadata version: 2023-03-30

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Qiang Xu, Nicola Nicolici:
Modular SOC testing with reduced wrapper count. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 24(12): 1894-1908 (2005)

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