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"On Enhancing Reliability of Weak PUFs via Intelligent Post-Silicon ..."

Md. Nazmul Islam, Vinay C. Patil, Sandip Kundu (2018)

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DOI: 10.1109/TCSI.2017.2766073

access: closed

type: Journal Article

metadata version: 2020-05-22

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Md. Nazmul Islam, Vinay C. Patil, Sandip Kundu:
On Enhancing Reliability of Weak PUFs via Intelligent Post-Silicon Accelerated Aging. IEEE Trans. Circuits Syst. I Regul. Pap. 65-I(3): 960-969 (2018)

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