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"A Sub-200-mV Voltage-Scalable SRAM With Tolerance of Access Failure by ..."

Shien-Chun Luo, Lih-Yih Chiou (2010)

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DOI: 10.1109/TCSII.2010.2048360

access: closed

type: Journal Article

metadata version: 2020-05-27

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Shien-Chun Luo, Lih-Yih Chiou:
A Sub-200-mV Voltage-Scalable SRAM With Tolerance of Access Failure by Self-Activated Bitline Sensing. IEEE Trans. Circuits Syst. II Express Briefs 57-II(6): 440-445 (2010)

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