"A Low-Voltage Measurement Testbed for Metrological Characterization of ..."

Mario Luiso et al. (2018)

Details and statistics

DOI: 10.1109/TIM.2018.2852940

access: closed

type: Journal Article

metadata version: 2022-01-03

a service of  Schloss Dagstuhl - Leibniz Center for Informatics