"Wafer-Level Defect Screening for "Big-D/Small-A" Mixed-Signal SoCs."

Sudarshan Bahukudumbi et al. (2009)

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DOI: 10.1109/TVLSI.2008.2006075

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type: Journal Article

metadata version: 2022-01-03

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Sudarshan Bahukudumbi, Sule Ozev, Krishnendu Chakrabarty, Vikram Iyengar:
Wafer-Level Defect Screening for "Big-D/Small-A" Mixed-Signal SoCs. IEEE Trans. Very Large Scale Integr. Syst. 17(4): 587-592 (2009)

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