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"Selecting Functional Test Sequences for Defect Diagnosis."

Irith Pomeranz (2018)

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DOI: 10.1109/TVLSI.2018.2849972

access: closed

type: Journal Article

metadata version: 2020-03-11

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  - https://dblp.org/rec/journals/tvlsi/Pomeranz18
Irith Pomeranz:
Selecting Functional Test Sequences for Defect Diagnosis. IEEE Trans. Very Large Scale Integr. Syst. 26(10): 2160-2164 (2018)

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